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dc.contributor.authorΤσέλιος, Κωνσταντίνοςell
dc.contributor.authorΟικονόμου, Γεώργιοςell
dc.contributor.authorΖώης, Ηλίας Ν.ell
dc.contributor.authorΝασιόπουλος, Αθανάσιος Α.ell
dc.identifier.citationTselios, K., Economou, G., Zois, E. and Nassiopoulos, A. (2011). Fusion of directional transitional features for off-line signature verification. In the Biometrics (IJCB), International Joint Conference on Biometrics Compendium. Washington, 11th-13th October 2011. pp. 1-6. IEEE.eng
dc.description.abstractn this work, a feature extraction method for off-line signature recognition and verification is proposed, described and validated. This approach is based on the exploitation of the relative pixel distribution over predetermined two and three-step paths along the signature trace. The proposed procedure can be regarded as a model for estimating the transitional probabilities of the signature stroke, arcs and angles. Partitioning the signature image with respect to its center of gravity is applied to the two-step part of the feature extraction algorithm, while an enhanced three-step algorithm utilizes the entire signature image. Fusion at feature level generates a multidimensional vector which encodes the spatial details of each writer. The classifier model is composed of the combination of a first stage similarity score along with a continuous SVM output. Results based on the estimation of the EER on domestic signature datasets and well known international corpuses demonstrate the high efficiency of the proposed methodology.eng
dc.rightsΑναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες*
dc.subjectSignature verification-
dc.subjectGrid feature-
dc.subjectΕπαλήθευση υπογραφής-
dc.subjectΧαρακτηριστικό πλέγμα-
dc.titleFusion of directional transitional features for off-line signature verificationeng
dc.typeΔημοσίευση σε συνέδριο-
heal.classificationElectrical engineering-
heal.classificationΗλεκτρολογική μηχανική-
heal.classificationURI**N/A**-Ηλεκτρολογική μηχανική-
heal.identifier.secondaryDOI: 10.1109/IJCB.2011.6117515-
heal.recordProviderΤ.Ε.Ι. Αθήνας. Σχολή Τεχνολογικών Εφαρμογών. Τμήμα Ηλεκτρονικών Μηχανικών Τ.Ε.ell
heal.conferenceNameBiometrics (IJCB), International Joint Conference on Biometrics Compendium, IEEEeng
heal.conferenceItemTypefull paper-
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