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Title: Modeling the pattern spectrum as a markov process and its use for efficient shape classification
Authors: Ζώης, Ηλίας Ν.
Αναστασόπουλος, Βασίλειος
Item type: Conference publication
Conference Item Type: Full Paper
Keywords: Shape classification;Image classification;Markov processes;Σχήμα ταξινόμησης;Ταξινόμηση εικόνας
Subjects: Electrical engineering
Ηλεκτρολογική μηχανική
Issue Date: 10-Jan-2015
Publisher: IEEE
Abstract: n this work the most important morphological granulometry, i.e. the pattern spectrum, is modeled, for the first time in the literature, as a first order Markov process. In addition, each of the terms of the process is shown to be normally distributed. The classification procedure followed for this specific application is based on modeling each separate class as a Markov process and making extensive use of the chain rule. Experimental results support the proposed classification procedure as quite promising, especially when compared to conventional classification techniques.
Description: Proceedings
Language: English
Citation: Zois, E. and Anastassopoulos, V. (2009). Modeling the pattern spectrum as a markov process and its use for efficient shape classification. In the 16th IEEE international conference on Image processing. Cairo, 7th-10th November 2009. pp. 429 - 432. IEEE.
Conference: IEEE international conference on Image processing
Access scheme: Embargo
License: Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες
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