Please use this identifier to cite or link to this item: http://hdl.handle.net/11400/4431
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dc.contributor.authorΚαλύβας, Νεκτάριος Ι.ell
dc.contributor.authorΜιχαήλ, Χρήστος Μ.ell
dc.contributor.authorΦούντος, Γεώργιος Π.ell
dc.contributor.authorΒαλαής, Ιωάννης Γ.ell
dc.contributor.authorΛιαπαρίνος, Παναγιώτης Φ.ell
dc.date.accessioned2015-01-21T12:01:32Z-
dc.date.issued2015-01-21-
dc.date.issued2011-
dc.identifier.citationKalyvas, N., Michail, C., Fountos, G., Valais, I., Liaparinos, P., et al. (October 2011). Modeling noise properties of a high resolution CMOS detector for X-ray digital mammography. In the Nuclear Science Symposium and Medical Imaging Conference. Valencia, 23th-29th October 2011. pp. 2465 - 2470. IEEE.eng
dc.identifier.urihttp://hdl.handle.net/11400/4431-
dc.description.abstractA theoretical model based on Linear Cascaded Systems (LCS) theory was developed in order to study the noise properties of a commercially available high resolution CMOS sensor (RadEye CMOS). The parameters studied were the Normalized Noise Power Spectrum (NNPS) and the Noise Transfer Function (NTF). The modeling was applied to digital mammography conditions. It considered the physical properties of the scintillator incorporated into RadEye CMOS as well as the probability of X-ray absorption directly in the photoreceptor. Furthermore it took into account the pixel pitch and the thickness of the photoreceptor. The model was compared with experimental results obtained from literature. The NTF curves were I good agreement with the experimentally determined. NNPS curves deviations were attributed to the effect of the digitization procedure as well as the non-linear behavior of CMOS detector.eng
dc.language.isoeng-
dc.publisherIEEEeng
dc.rightsΑναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/3.0/us/*
dc.subjectExtended X-ray absorption fine structure-
dc.subjectX-ray detection-
dc.subjectΑπορρόφηση ακτίνων Χ-
dc.subjectΑνίχνευση ακτίνων Χ-
dc.titleModeling noise properties of a high resolution CMOS detector for X-ray digital mammographyeng
dc.typeΔημοσίευση σε συνέδριο-
heal.classificationMedicine-
heal.classificationMedical technology-
heal.classificationΙατρική-
heal.classificationΙατρική τεχνολογία-
heal.classificationURIhttp://id.loc.gov/authorities/subjects/sh00006614-
heal.classificationURIhttp://skos.um.es/unescothes/C02465-
heal.classificationURI**N/A**-Ιατρική-
heal.classificationURI**N/A**-Ιατρική τεχνολογία-
heal.keywordURIhttp://id.loc.gov/authorities/subjects/sh85046548-
heal.contributorNameΣεφέρης, Ιωάννης Ε.ell
heal.contributorNameΣπυροπούλου, Βασιλική Α.ell
heal.contributorNameΜυταφίδης, Αλέξανδρος Κ.ell
heal.contributorNameΠαναγιωτάκης, Γεώργιος Σ.ell
heal.contributorNameΚανδαράκης, Ιωάννης Σ.ell
heal.identifier.secondaryDOI: 10.1109/NSSMIC.2011.6152669-
heal.dateAvailable10000-01-01-
heal.accessembargo-
heal.recordProviderΤ.Ε.Ι. Αθήνας. Σχολή Τεχνολογικών Εφαρμογών. Τμήμα Μηχανικών Βιοϊατρικής Τεχνολογίας Τ.Ε.ell
heal.fullTextAvailabilitytrue-
heal.conferenceNameNuclear Science Symposium and Medical Imaging Conferenceeng
heal.conferenceItemTypefull paper-
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