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|Title:||Experimental determination of luminescence emission properties of lyso: CE and CSI: TL single crystal scintillators under uv and x-ray exposures for use in medical imaging|
|Authors:||Βαλαής, Ιωάννης Γ.|
Κανδαράκης, Ιωάννης Σ.
Παναγιωτάκης, Γεώργιος Σ.
|Item type:||Conference publication|
|Conference Item Type:||Full Paper|
|Keywords:||Inorganic scintillators;Nuclear counters;Ανόργανοι σπινθηριστές;Ανιχνευτές ακτινοβολίας|
|Abstract:||Cesium iodide doped with thallium, CsI: Tl, is a high efficiency scintillator yielding high resolution images. It has been used in several diagnostic equipment, especially in fluoroscopy, in single photon emission computed tomography (SPECT) and in x-ray computed tomography (CT) systems. Lutetium-yttrium based scintillators, such as LYSO: Ce, are high effective atomic number, non-hygroscopic, fast emitting materials, promising candidates for use in positron emission (PET) imagers. The present study investigates the light emission characteristics of LYSO: Ce and CsI: Tl single crystal scintillators under UV and x-ray medical imaging conditions. To this aim parameters related to the luminescence emission spectrum and emission efficiency were studied using experimental methods. Various x-ray tube voltages currently employed in x-ray imaging techniques were used. In addition the emission spectrum under UV and x-ray excitation was used to determine the spectral compatibility to optical photon detectors incorporated in medical imaging systems. LYSO: Ce was found of equally high efficiency, however LYSO: Ce may be considered more suitable for computerized tomographic applications due to its very fast temporal response.|
|Citation:||Valais, I., Kandarakis, I., Nikolopoulos, D., Loudos, G., Giokaris, N., et al. (2005). Experimental determination of luminescence emission properties of lyso: CE and CSI: TL single crystal scintillators under uv and x-ray exposures for use in medical imaging. In the 1st International Conference on Experiments/Process/System Modelling/Simulation/Optimization. Athens, 6th-9th July 2005.|
|Conference:||International Conference on Experiments/Process/System Modelling/Simulation/Optimization|
|License:||Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες|
|Appears in Collections:||Δημοσιεύσεις|
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