Please use this identifier to cite or link to this item: http://hdl.handle.net/11400/5587
Title: X-ray image degradation passing through thin glass substrate
Authors: Σεφέρης, Ιωάννης Ε.
Μιχαήλ, Χρήστος Μ.
Βαλαής, Ιωάννης Γ.
Φούντος, Γεώργιος Π.
Καλύβας, Νεκτάριος Ι.
Contributors: Στρωματιά, Φωτεινή
Κανδαράκης, Ιωάννης Σ.
Παναγιωτάκης, Γεώργιος Σ.
Item type: Conference publication
Keywords: Nuclear medicine;Πυρηνική ιατρική;MTF;Image degradation;Scintillating screen;Σπινθηρίζουσα οθόνη;Υποβάθμιση εικόνας
Subjects: Medicine
Medical physics
Ιατρική
Ιατρική φυσική
Issue Date: 3-Feb-2015
2012
Date of availability: 3-Feb-2015
Publisher: Νερατζής, Ηλίας
Σιανούδης, Ιωάννης
Βαλαής, Ιωάννης Γ.
Φούντος, Γεώργιος Π.
Abstract: The degradation of X-ray image passing through thin glass substrate was experimentally investigated in term of modulation transfer function (MTF). The screen was prepared by sedimentation of the powder phosphor (Gd2O2S:Eu) on thin glass substrate with thickness 140 m (Waldemar Knittel- GmbH). The experiment was carried out under X-ray mammographic conditions. The beam quality was 28 kV, 60 mAs, with W/Rh target/filter combination. The screen was coupled to an optical readout device including a CMOS remote RadEye HR photodiode pixel array. Results showed that there is a 40% degradation of the MTF on average, in the whole spatial frequency range, due to the glass substrate. The glass substrate has a low impact on resolution of the image at low frequencies (12% on average, up to 2.7 cy/mm) and a high impact at medium and high frequencies (70% on average).
Description: Special issue: Workshop on Bio-Medical Instrumentation and related Engineering And Physical Sciences, Technological Educational Institute of Athens, 6 July 2012
Language: English
Citation: Seferis, I.E., Michail, C.M., Valais, I.G., Fountos, G.P., Kalyvas, N.I., et al. (2012). X-ray image degradation passing through thin glass substrate. "e-Journal of Science & Technology". [Online] 7(3): 29-31. Available from: http://e-jst.teiath.gr/
Journal: e-Περιοδικό Επιστήμης & Τεχνολογίας
e-Journal of Science & Technology
Type of Journal: With a review process (peer review)
Access scheme: Publicly accessible
License: Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες
URI: http://hdl.handle.net/11400/5587
Appears in Collections:Τόμος 07, τεύχος 3 (2012)

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