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Title: Two-pattern generation based on accumulators with 1’s complement adders
Authors: Βογιατζής, Ιωάννης
Ευσταθίου, Κωνσταντίνος Η.
Item type: Conference publication
Conference Item Type: Poster
Keywords: Testing;Built in self test;Design for testability;Integrated circuit reliability;Self-testing;Χτισμένο σε αυτοέλεγχο;Σχεδιασμός για ελεγξιμότητα;Ολοκληρωμένη αξιοπιστία;Αυτο-δοκιμή
Subjects: Computer science
Computer programming
Issue Date: 16-Mar-2015
Language: Greek
Conference: Design and Test of Integrated Systems in Nanoscale Technology, 2006. DTIS
Access scheme: Embargo
License: Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες
Appears in Collections:Αποτελέσματα ερευνητικών έργων

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