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Title: A sic pair generator for a bilbo environment
Authors: Βογιατζής, Ιωάννης
Κεχαγιάς, Ιωάννης Δημ. (1971-)
Item type: Journal article
Keywords: Built-In Self Test;SIC pairs;SIC ζεύγη;BILBO registers;Μητρώα BILBO;Two-pattern test generation;Delay fault testing;Έλεγχος βραχυκυκλώματος καθυστέρηση
Subjects: Computer science
Computer programming
Issue Date: 18-Mar-2015
Date of availability: 18-Mar-2015
Abstract: Built-In Self Test (BIST) techniques are commonly used as an efficient alternative to external testing in today's high-complexity VLSI chips since they provide on-chip test pattern generation and response verification. Among the BIST techniques, Built-In Logic Block Observation (BILBO) has been widely used in practice. Test patterns generated by BILBO structures target the detection of stuck-at faults.It has been shown that most common failure mechanisms that appear into current CMOS VLSI circuits cannot be modeled as stuck-at faults. These mechanisms, modeled by sequential (i.e., stuck-open and delay) faults models, require the application of two-pattern tests (vector pairs) in the circuit-under-test inputs. Single Input Change (SIC) pairs are pairs of patterns where the second pattern differs from the first in only one bit and have been successfully used for two-pattern testing.In this paper we present the BILBO-oriented SIC pair Generator technique that extends BILBO in order to generate SIC pairs; in this way, sequential faults are also detected.Read More:
Language: English
Journal: Journal of Circuits, Systems and Computers
Type of Journal: With a review process (peer review)
Access scheme: Publicly accessible
License: Αναφορά Δημιουργού-Μη Εμπορική Χρήση-Όχι Παράγωγα Έργα 3.0 Ηνωμένες Πολιτείες
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