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Issue Date	Title	Author(s)
2015-05-19; 2004-09	Effects of photoresist polymer molecular weight on line-edge roughness and its metrology probed with Monte Carlo simulations	Πάτσης, Γεώργιος; Κωνσταντούδης, Βασίλειος; Γογγολίδης, Ευάγγελος
2015-05-19; 2004-02-22	Toward a complete description of linewidth roughness	Κωνσταντούδης, Βασίλειος; Πάτσης, Γεώργιος; Leunissen, Leonardus H. A.; Γογγολίδης, Ευάγγελος
2015-05-20; 2004-08-17	Line edge roughness and critical dimension variation	Κωνσταντούδης, Βασίλειος; Πάτσης, Γεώργιος; Γογγολίδης, Ευάγγελος; Leunissen, Leonardus H. A.